- About Us
- Consulting & Services
- EMF/EMI Overview
- Project Portfolio
- Contact Us
Overview: As metrology and research tools continue to improve in functionality and measurement resolution, they become more sensitive to environmental changes including electromagnetic interference (EMI), vibrations and acoustics.
Siting sensitive instruments, whether they are an electron-microscope or other E-Beam tool, research magnets, or other instrument always requires cognizance of the electromagnetic field (EMF) environment and the various types and location of the emission sources.
As part of a Design-Build project to create 4 electromagnetically quiet electron microscope (EM) rooms for the new Irvine Materials Research Institute at UC Irvine, FMS evaluated several of the leading commercially available magnetic field active compensation (ACS) systems and …
Over its 20 years, FMS has successfully completed hundreds of EMI projects which included a diverse range of consulting and mitigation services.