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Overview: As metrology and research tools continue to improve in functionality and measurement resolution, they become more sensitive to environmental changes including electromagnetic interference (EMI), vibrations and acoustics.
Siting sensitive instruments, whether they are an electron-microscope or other E-Beam tool, research magnets, or other instrument always requires cognizance of the electromagnetic field (EMF) environment and the various types and location of the emission sources.
Over its 20 years, FMS has successfully completed hundreds of EMI projects which included a diverse range of consulting and mitigation services.